Root cause study on lid adhesion failure.
| Autor: | Ong, M.C., Zhao, X.L., Zee, B., Joman, P.P., Chin, J.M., Master, R.N. |
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| Zdroj: | 2008 33rd IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT); 2008, p1-5, 5p |
| Databáze: | Complementary Index |
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