Solutions for 45/40nm ELK device integration into Flip Chip and Wire Bond packaging.

Autor: Beleran, John, Hong, Tan Hua, Wilson, Ong Pl, Zhang, X R, Amurao, Gatbonton Librado, Mehta, Gaurav, Zhu, Wh
Zdroj: 2010 Proceedings 60th Electronic Components & Technology Conference (ECTC); 2010, p1604-1612, 9p
Databáze: Complementary Index