Characterization of microprocessor chip stress distributions during component packaging and thermal cycling.

Autor: Roberts, Jordan, Hussain, Safina, Rahim, M. Kaysar, Motalab, Mohammad, Suhling, Jeffrey C., Jaeger, Richard C., Lall, Pradeep, Zhang, Ron
Zdroj: 2010 Proceedings 60th Electronic Components & Technology Conference (ECTC); 2010, p1281-1295, 15p
Databáze: Complementary Index