3D chip stacking & reliability using TSV-micro C4 solder interconnection.

Autor: Au, K. Y., Kriangsak, S. L., Zhang, X. R., Zhu, W. H., Toh, C. H.
Zdroj: 2010 Proceedings 60th Electronic Components & Technology Conference (ECTC); 2010, p1376-1384, 9p
Databáze: Complementary Index