Computation of yield-optimized Pareto fronts for analog integrated circuit specifications.
| Autor: | Mueller-Gritschneder, D., Graeb, H. |
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| Zdroj: | 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2010, p1088-1093, 6p |
| Databáze: | Complementary Index |
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