Phase shifting microwave structure employing atomic layer deposited (ALD) and ferroelectric films on flexible substrates.

Autor: Kotha, R., Elam, D., Chabanov, A., Chen, C.L., Ayon, A.A.
Zdroj: 2010 Symposium on Design Test Integration & Packaging of MEMS/MOEMS (DTIP); 2010, p232-236, 5p
Databáze: Complementary Index