Wavelet analysis of current measurements for mixed-signal circuit testing.

Autor: Dimopoulos, M.G., Papakostas, D.K., Vassios, B.D., Hatzopoulos, A.A.
Zdroj: Proceedings of 2010 IEEE International Symposium on Circuits & Systems (ISCAS); 2010, p1923-1926, 4p
Databáze: Complementary Index