The failure of VDMOS device caused by the mismatch of coefficient of thermal expansion.
| Autor: | Yin Jinghua, Xu Dan, Hua Qing, He Yanqiang, Song Mingxin, Cao Yijiang |
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| Zdroj: | 2010 10th IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT); 2010, p1716-1718, 3p |
| Databáze: | Complementary Index |
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