A bilateral comparison of on-wafer S-parameter measurements at millimeter wavelengths.
| Autor: | Clarke, R.G., Quraishi, J., Ridler, N.M. |
|---|---|
| Zdroj: | ARFTG Conference, 2007 69th; 2007, p1-7, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Clarke, R.G., Quraishi, J., Ridler, N.M. |
|---|---|
| Zdroj: | ARFTG Conference, 2007 69th; 2007, p1-7, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|