Fault progression modeling: An application to bearing diagnosis and prognosis.
| Autor: | Bin Zhang, Sconyers, C., Orchard, M., Patrick, R., Vachtsevanos, G. |
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| Zdroj: | American Control Conference (ACC), 2010; 2010, p6993-6998, 6p |
| Databáze: | Complementary Index |
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