A methodology for reliability prediction: Thermal and RF MEMS case of studies.
| Autor: | Matmat, M., Boukabache, H., Marty, A., Esteve, D., Escriba, C., Fourniols, J.Y. |
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| Zdroj: | 2011 IEEE Sensors; 2011, p1677-1680, 4p |
| Databáze: | Complementary Index |
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