Delay defect screening using process monitor structures.
| Autor: | Mitra, S., Volkerink, E., McCluskey, E.J., Eichenberger, S. |
|---|---|
| Zdroj: | 22nd IEEE VLSI Test Symposium, 2004. Proceedings; 2004, p43-48, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Mitra, S., Volkerink, E., McCluskey, E.J., Eichenberger, S. |
|---|---|
| Zdroj: | 22nd IEEE VLSI Test Symposium, 2004. Proceedings; 2004, p43-48, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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