ELF-Murphy data on defects and tests sets.
| Autor: | McCluskey, E.J., Al-Yamani, A., Li, J.C.-M., Chao-Wen Tseng, Volkerink, E., Ferhani, F.-F., Li, E., Mitra, S. |
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| Zdroj: | 22nd IEEE VLSI Test Symposium, 2004. Proceedings; 2004, p16-22, 7p |
| Databáze: | Complementary Index |
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