Excitation, observation, and ELF-MD: optimization criteria for high quality test sets.
| Autor: | Dworak, J., Dorsey, D., Wang, A., Mercer, M.R. |
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| Zdroj: | 22nd IEEE VLSI Test Symposium, 2004. Proceedings; 2004, p9-15, 7p |
| Databáze: | Complementary Index |
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