A reflectance spectroscopy-based tool for high-speed characterization of silicon wafers and solar cells in commercial production.
| Autor: | Sopori, B., Rupnowski, P., Guhabiswas, D., Devayajanam, S., Shet, S., Khattak, C.P., Albert, M. |
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| Zdroj: | 2010 35th IEEE Photovoltaic Specialists Conference (PVSC); 2010, p002238-002241, 4p |
| Databáze: | Complementary Index |
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