RF Arrhenius life testing of X-band high voltage GaAs PHEMTs.
Autor: | Mittereder, J.A., Cronk, N.S., Binari, S.C., Via, G.D., Fanning, D., Tserng, H., Saunier, P., Decker, K., Beam, E. |
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Zdroj: | 2009 Reliability of Compound Semiconductors Digest (ROCS); 2009, p103-108, 6p |
Databáze: | Complementary Index |
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