RF Arrhenius life testing of X-band high voltage GaAs PHEMTs.
| Autor: | Mittereder, J.A., Cronk, N.S., Binari, S.C., Via, G.D., Fanning, D., Tserng, H., Saunier, P., Decker, K., Beam, E. |
|---|---|
| Zdroj: | 2009 Reliability of Compound Semiconductors Digest (ROCS); 2009, p103-108, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|