A test pattern matching method on bast architecture using don't care identification for random pattern resistant faults.
| Autor: | Hosokawa, T., Yun Chen, LingLing Wan, Wakazono, M., Yoshimura, M. |
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| Zdroj: | 2010 International Symposium on Communications & Information Technologies (ISCIT); 2010, p738-743, 6p |
| Databáze: | Complementary Index |
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