A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores.
Autor: | Sharma, Manish, Dutta, Avijit, Cheng, Wu-Tung, Benware, Brady, Kassab, Mark |
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Zdroj: | 2011 IEEE International Test Conference (ITC); 2011, p1-9, 9p |
Databáze: | Complementary Index |
Externí odkaz: |
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