Surviving state disruptions caused by test: A case study.
| Autor: | Parker, Kenneth P., Kameyama, Shuichi, Dubberke, David |
|---|---|
| Zdroj: | 2011 IEEE International Test Conference (ITC); 2011, p1-8, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Parker, Kenneth P., Kameyama, Shuichi, Dubberke, David |
|---|---|
| Zdroj: | 2011 IEEE International Test Conference (ITC); 2011, p1-8, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|