Defect-oriented cell-internal testing.
| Autor: | Hapke, F., Redemund, W., Schloeffel, J., Krenz-Baath, R., Glowatz, A., Wittke, M., Hashempour, H., Eichenberger, S. |
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| Zdroj: | 2010 IEEE International Test Conference (ITC); 2010, p1-10, 10p |
| Databáze: | Complementary Index |
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