Low dose rate test results of national semiconductor's ELDRS-free bipolar comparators LM111 and LM119.
| Autor: | Kruckmeyer, K., McGee, L., Brown, B., Miller, L. |
|---|---|
| Zdroj: | 2009 European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2009, p586-592, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|