ELFR experiment test verifying anomaly of nano-DRAM products in W-plug process.
| Autor: | Chiao-Lo Chiang, Mu-Chun Wang, Yu-Min Chung, Chung-Ming Chu, Shou-Kong Fan, Chin-Chia Kuo, I-Shan Yen |
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| Zdroj: | 2010 International Symposium on Next-Generation Electronics (ISNE); 2010, p250-253, 4p |
| Databáze: | Complementary Index |
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