Broadband measurements of nanofiber devices: Repeatability and random error analysis.

Autor: Wallis, T.M., Imtiaz, A., Sang-Hyun Lim, Kabos, P., Kichul Kim, Rice, P., Filipovic, D.
Zdroj: Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG; 2010, p1-6, 6p
Databáze: Complementary Index