Broadband measurements of nanofiber devices: Repeatability and random error analysis.
Autor: | Wallis, T.M., Imtiaz, A., Sang-Hyun Lim, Kabos, P., Kichul Kim, Rice, P., Filipovic, D. |
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Zdroj: | Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG; 2010, p1-6, 6p |
Databáze: | Complementary Index |
Externí odkaz: |