The effect of dielectric anisotropy and metal surface roughness.
| Autor: | Rautio, J.C., Rautio, B.J., Arvas, S., Horn, A.F., Reynolds, J.W. |
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| Zdroj: | Microwave Conference Proceedings (APMC), 2010 Asia-Pacific; 2010, p1777-1780, 4p |
| Databáze: | Complementary Index |
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