90nm node RF CMOS technology with latch-up immunity on high-resistivity substrate.

Autor: Momo, N., Higashi, Y., Oda, M., Matsuzawa, K., Kokubun, K., Ohguro, T., Momose, H.S., Toyoshima, Y.
Zdroj: 2009 European Microwave Integrated Circuits Conference (EuMIC); 2009, p65-68, 4p
Databáze: Complementary Index