Hot carrier impact on the small signal equivalent circuit.
| Autor: | Negre, L., Roy, D., Boret, S., Scheer, P., Kauffmann, N., Gloria, D., Ghibaudo, G. |
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| Zdroj: | 2010 IEEE International Integrated Reliability Workshop Final Report (IRW); 2010, p72-75, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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