A novel CVD-SiBCN Low-K spacer technology for high-speed applications.

Autor: Ko, C.H., Kuan, T.M., Kangzhan Zhang, Tsai, G., Seutter, S.M., Wu, C.H., Wang, T.J., Ye, C.N., Chen, H.W., Ge, C.H., Wu, K.H., Lee, W.C.
Zdroj: 2008 Symposium on VLSI Technology; 2008, p108-109, 2p
Databáze: Complementary Index