Fine pitch low temperature rdl damascene process development for TSV integration.

Autor: Li, H. Y., Pang, X. F., Ong, L. G., Li, H. B., Lee, W. S., Khan, Navas, Teo, K. H., Gao, S.
Zdroj: 2010 12th Electronics Packaging Technology Conference (EPTC); 2010, p52-55, 4p
Databáze: Complementary Index