Device simulation for evaluating effects of mechanical stress on semiconductor devices: Impact of stress-induced variation of electron effective mass.
| Autor: | Koganemaru, M., Yoshida, K., Ikeda, T., Miyazaki, N., Tomokage, H. |
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| Zdroj: | Electronic System-Integration Technology Conference (ESTC), 2010 3rd; 2010, p1-6, 6p |
| Databáze: | Complementary Index |
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