Impact of ESD strategy on EMC performances: Conducted emission and DPI immunity.
Autor: | Abouda, Kamel, Besse, Patrice, Rolland, Eric |
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Zdroj: | 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2011, p224-229, 6p |
Databáze: | Complementary Index |
Externí odkaz: |