Overcoming the unselected pin relay capacitance HBM tester artifact with two pin HBM testing.
| Autor: | Ward, S., Burgess, K., Grund, E., Schichl, J., Duvvury, C., Koeppen, P., Kunz, H. |
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| Zdroj: | 2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD); 2010, p1-8, 8p |
| Databáze: | Complementary Index |
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