Retention Reliability Improvement of SONOS Non-volatile Memory with N2O Oxidation Tunnel Oxide.
| Autor: | Jia-Lin Wu, Chin-Hsing Kao, Hua-Ching Chien, Tzung-Kuen Tsai, Chih-Yuan Lee, Chien-Wei Liao, Chung-Yu Chou, Min-I Yang |
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| Zdroj: | 2006 IEEE International Integrated Reliability Workshop Final Report; 2006, p209-212, 4p |
| Databáze: | Complementary Index |
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