Temperature Effects on the Hot-Carrier Induced Degradation of pMOSFETs.
| Autor: | Shuang-Yuan Chen, Chia-Hao Tu, Jung-Chun Lin, Po-Wei Kao, Wen-Cheng Lin, Ze-Wei Jhou, Sam Chou, Joe Ko, Heng-Sheng Haung |
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| Zdroj: | 2006 IEEE International Integrated Reliability Workshop Final Report; 2006, p163-166, 4p |
| Databáze: | Complementary Index |
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