Organic transistor technology options for device performance versus technology options for increased circuit reliability and yield on foil.
Autor: | Genoe, J., Myny, K., Steudel, S., Smout, S., Vicca, P., van der Putten, B., Tripathi, A.K., van Aerle, N.A.J.M., Gelinck, G.H., Dehaene, W., Heremans, P. |
---|---|
Zdroj: | 2010 Device Research Conference (DRC); 2010, p171-174, 4p |
Databáze: | Complementary Index |
Externí odkaz: |