Tradeoffs in Imager Design with Respect to Pixel Defect Rates.
| Autor: | Chapman, G.H., Leung, J., Koren, I., Koren, Z. |
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| Zdroj: | 2010 IEEE 25th International Symposium on Defect & Fault Tolerance in VLSI Systems (DFT); 2010, p231-239, 9p |
| Databáze: | Complementary Index |
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