System event triggered latch-up in IC chips: test issues and chip level protection design.
| Autor: | Wang, Dening, Marum, Steve, Kemper, Wolfgang, McLain, David |
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| Zdroj: | 2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p1-7, 7p |
| Databáze: | Complementary Index |
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