Design and characterization of a multi-RC-triggered MOSFET-based power clamp for on-chip ESD protection.
Autor: | Li, Junjun, Gauthier, Robert, Mitra, Souvick, Putnam, Christopher, Chatty, Kiran, Halbach, Ralph, Seguin, Christopher |
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Zdroj: | 2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p179-185, 7p |
Databáze: | Complementary Index |
Externí odkaz: |