Design and characterization of a multi-RC-triggered MOSFET-based power clamp for on-chip ESD protection.

Autor: Li, Junjun, Gauthier, Robert, Mitra, Souvick, Putnam, Christopher, Chatty, Kiran, Halbach, Ralph, Seguin, Christopher
Zdroj: 2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p179-185, 7p
Databáze: Complementary Index