Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid.
| Autor: | Jain, V.K., Chapman, G.H. |
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| Zdroj: | 2011 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 2011, p235-242, 8p |
| Databáze: | Complementary Index |
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