Partitioned HBM test — A new method to perform HBM tests on complex devices.
| Autor: | Gaertner, R., Aburano, R., Brodbeck, T., Gossner, H., Schaafhausen, J., Stadler, W., Zaengl, F. |
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| Zdroj: | 2005 Electrical Overstress/Electrostatic Discharge Symposium; 2005, p1-6, 6p |
| Databáze: | Complementary Index |
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