Reliability properties of low voltage PZT ferroelectric capacitors and arrays.
| Autor: | Rodriguez, J., Remack, K., Boku, K., Udayakumar, K.R., Aggarwal, S., Summerfelt, S., Moise, T., McAdams, H., McPherson, J., Bailey, R., Depner, M., Fox, G. |
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| Zdroj: | Proceedings of the 2004 IEEE International Reliability Physics Symposium; 2004, p200-208, 9p |
| Databáze: | Complementary Index |
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