Degradation of commercially available DAC ICs in a mixed-radiation environment.
| Autor: | Aghara, S., Fink, R.J., Charlton, W.S., Bhuva, B., Samadi, M.R., Ochoa, J.A., Porter, J.R. |
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| Zdroj: | 2003 IEEE Radiation Effects Data Workshop; 2003, p34-37, 4p |
| Databáze: | Complementary Index |
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