Current filament movement and silicon melting in an ESD-robust DENMOS transistor.
| Autor: | Steinhoff, R.M., Jin-Biao Huang, Hower, P.L., Brodsky, J.S. |
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| Zdroj: | 2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-10, 10p |
| Databáze: | Complementary Index |
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