A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains.
| Autor: | Gieser, H.A., Wolf, H., Soldner, W., Reichl, H., Andreini, A., Natarajan, M.I., Stadler, W. |
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| Zdroj: | 2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-10, 10p |
| Databáze: | Complementary Index |
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