Minimizing defective part level using a linear programming-based optimal test selection method.
| Autor: | Yuxin Tian, Grimaila, M.R., Weiping Shi, Mercer, M.R. |
|---|---|
| Zdroj: | Test Symposium, 2003. ATS 2003. 12th Asian; 2003, p354-359, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|