Exhaustive test of several dependable memory architectures designed by GRAAL tool.
Autor: | Bertuccelli, F., Bigongiari, F., Brogna, A.S., Di Natale, G., Prinetto, P., Saletti, R. |
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Zdroj: | Test Symposium, 2003. ATS 2003. 12th Asian; 2003, p32-35, 4p |
Databáze: | Complementary Index |
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