Exhaustive test of several dependable memory architectures designed by GRAAL tool.

Autor: Bertuccelli, F., Bigongiari, F., Brogna, A.S., Di Natale, G., Prinetto, P., Saletti, R.
Zdroj: Test Symposium, 2003. ATS 2003. 12th Asian; 2003, p32-35, 4p
Databáze: Complementary Index