Self-interference fluorescent emission microscopy 5-nm vertical resolution.
| Autor: | Swan, A.K., Unlu, M.S., Tong, Y., Goldberg, B.B., Moiseev, L., Cantor, C. |
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| Zdroj: | Technical Digest. Summaries of Papers Presented at the Conference on Lasers & Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170); 2001, p360-361, 2p |
| Databáze: | Complementary Index |
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