Industrial experience with test generation languages gar processor verification.
| Autor: | Behm, M., Ludden, J., Lichtenstein, Y., Rimon, M., Vinov, M. |
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| Zdroj: | Proceedings 41st Design Automation Conference, 2004; 2004, p36-40, 5p |
| Databáze: | Complementary Index |
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