Impact of memory cell array bridges on the faulty behavior in embedded DRAMs.
Autor: | Zaid Al-Ars, van de Goor, A.J. |
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Zdroj: | Proceedings of the Ninth Asian Test Symposium; 2000, p282-289, 8p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Zaid Al-Ars, van de Goor, A.J. |
---|---|
Zdroj: | Proceedings of the Ninth Asian Test Symposium; 2000, p282-289, 8p |
Databáze: | Complementary Index |
Externí odkaz: |