Use of Cf252 isotope facility to unfold SEU cross section in integrated circuits.
Autor: | Zinchenko, V.F., Derevjanko, Y.B., Lipsky, A.K. |
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Zdroj: | Proceedings of the 7th European Conference on Radiation & Its Effects on Components & Systems, 2003 (RADECS 2003); 2003, p141-145, 5p |
Databáze: | Complementary Index |
Externí odkaz: |