Use of Cf252 isotope facility to unfold SEU cross section in integrated circuits.

Autor: Zinchenko, V.F., Derevjanko, Y.B., Lipsky, A.K.
Zdroj: Proceedings of the 7th European Conference on Radiation & Its Effects on Components & Systems, 2003 (RADECS 2003); 2003, p141-145, 5p
Databáze: Complementary Index