Off current adjustment in ultra-thin SOI MOSFETs.

Autor: Hartwich, J., Dreeskornfeld, L., Hofmann, F., Kretz, J., Landgraf, E., Luyken, R.J., Specht, M., Stadele, M., Schulz, T., Rosner, W., Risch, L.
Zdroj: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850); 2004, p305-308, 4p
Databáze: Complementary Index